DOI:10.1063/1.124554 - Corpus ID: 40826391
Measurement of mechanical resonance and losses in nanometer scale silicon wires
@article{Carr1999MeasurementOM, title={Measurement of mechanical resonance and losses in nanometer scale silicon wires}, author={Dustin Carr and Stephane Evoy and Lidija Sekaric and Harold G. Craighead and Jeevak M Parpia}, journal={Applied Physics Letters}, year={1999}, volume={75}, pages={920-922}, url={https://api.semanticscholar.org/CorpusID:40826391} }
We present data on nanofabricated suspended silicon wires driven at resonance. The wires are electrostatically driven and detected optically. We have observed wires with widths as small as 45 nm and…
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