Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/tcad/YenCWCLKWC23 AU - Yen, Chia-Heng AU - Chen, Chun-Teng AU - Wen, Cheng-Yen AU - Chen, Ying-Yen AU - Lee, Jih-Nung AU - Kao, Shu-Yi AU - Wu, Kai-Chiang AU - Chao, Mango Chia-Tso TI - CNN-Based Stochastic Regression for IDDQ Outlier Identification. JO - IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. VL - 42 IS - 11 SP - 4282 EP - 4295 PY - 2023/11/ DO - 10.1109/TCAD.2023.3253043 UR - https://doi.org/10.1109/TCAD.2023.3253043 ER - TY - CPAPER ID - DBLP:conf/vts/YangYWCCCLKWC21 AU - Yang, Cheng-Hao AU - Yen, Chia-Heng AU - Wang, Ting-Rui AU - Chen, Chun-Teng AU - Chern, Mason AU - Chen, Ying-Yen AU - Lee, Jih-Nung AU - Kao, Shu-Yi AU - Wu, Kai-Chiang AU - Chao, Mango Chia-Tso TI - Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks. BT - 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021 SP - 1 EP - 7 PY - 2021// DO - 10.1109/VTS50974.2021.9441055 UR - https://doi.org/10.1109/VTS50974.2021.9441055 ER - TY - CPAPER ID - DBLP:conf/vts/ChenYWYWCCKLKC20 AU - Chen, Chun-Teng AU - Yen, Chia-Heng AU - Wen, Cheng-Yen AU - Yang, Cheng-Hao AU - Wu, Kai-Chiang AU - Chern, Mason AU - Chen, Ying-Yen AU - Kuo, Chun-Yi AU - Lee, Jih-Nung AU - Kao, Shu-Yi AU - Chao, Mango Chia-Tso TI - CNN-based Stochastic Regression for IDDQ Outlier Identification. BT - 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020 SP - 1 EP - 6 PY - 2020// DO - 10.1109/VTS48691.2020.9107570 UR - https://doi.org/10.1109/VTS48691.2020.9107570 ER -