Abstract
In this paper a wavelet-based parameter estimation method has been proposed for the common emitter transistor amplifier circuit and compared with the least squares method. As the maximal precision of simulation requires the modeling of electronic circuits in terms of device parameters and circuit components, the Volterra model of the common emitter amplifier circuit derived using the Ebers–Moll model and perturbation technique has been used for parameter estimation. The advantage of the proposed method is a smaller data storage requirement and accurate parameter estimation as compared to the least squares method because the wavelet method is adapted to time-frequency resolution.
Similar content being viewed by others
References
I. Daubechies, Ten Lectures on Wavelets (Society for Industrial and Applied Mathematics, Philadelphia, 1992)
M.W. Frazier, An Introduction to Wavelets Through Linear Algebra (Springer, New York, 1999)
J. Gao, X. Dong, W.-B. Wang, Y. Li, C. Pan, Instantaneous parameter extraction via wavelet transform. IEEE Trans. Geosci. Remote Sens. 37(2), 867–870 (1999)
P.A. Linden, V.F. Fusco, Concurrent global optimisation for microwave device parameter estimation. IEE Proc. H 140(2), 71–78 (1993)
S. Majumdar, H. Parthasarathy, Perturbation approach to Ebers–Moll modeled transistor amplifier circuit. Circuits Syst. Signal Process. doi:10.1007/s00034-010-9153-0
S. Narayanan, Application of Volterra series to intermodulation distortion analysis of transistor feedback amplifiers. IEEE Trans. Circuit Theory 17(4), 518–527 (1970)
R. Pagano, Characterization, parameter identification, and modeling of a new monolithic emitter switching bipolar transistor. IEEE Trans. Electron Devices 53(5), 1235–1244 (2006)
R.J. Prazenica, R. Lind, A.J. Kurdila, Uncertainty estimation from Volterra kernels for robust flutter analysis. J. Guid. Control Dyn. 26(2), 331–337 (2003)
S. Riccardo, E. Danilo, G. Emilio, Perturbation approach for low frequency noise in junction field effect transistor. Appl. Math. Comput. 74, 2–3 (1996)
L.I. Schiff, Quantum Mechanics, 2nd edn. (McGraw-Hill, New York, 1955)
D.M.M.-P. Schreurs, J. Verpecht, S. Vandenberghe, E. Vandamme, Straightforward and accurate nonlinear device model parameter estimation method based on vectorial large-signal measurements. IEEE Trans. Microw. Theory Tech. 50(10), 2315–2319 (2002)
B. Toner, V.F. Fusco, Waveform based MOSFET dynamic large-signal parameter estimation. IEE Proc., Microw. Antennas Propag. 150(6), 451–458 (2003)
H.-C. Tseng, J.-H. Chou, An efficient analytic approach for extracting the emitter inductance of collector-Up HBTs. IEEE Trans. Electron Devices 51(7), 1200–1202 (2004)
M. Vadyanathan, M. Iwamoto, L.E. Larson, P.S. Gudem, P.M. Asbeck, The theory of high frequency distortion in bipolar transistors. IEEE Trans. Microw. Theory Tech. 51(2), 448–461 (2003)
V.B. Vats, H. Parthasarathy, Parameter estimation for time varying nonlinear circuit from state analysis and simulation. Commun. Nonlinear Sci. Simul. 13(4), 839–846 (2008)
J. Vuolevi, T. Rahkonen, Analysis of third order intermodulation distortion in common emitter BJT and HBT amplifiers, IEEE Trans. Circuits Syst. 50(12) (2003)
H. Wang, H.Z. Yang, G.Z. Hu, Combinatorial algorithms for BJT model parameter extraction, in ICSE’ 96 Proc., Penang, Malaysia, 1996
G. Yanxia, M. Yingying, G. Shuibao, W. Daohong, The parameter identification and validation for IGBT based on optimization algorithm, in 2nd International Conference on Power Electronics, Systems and Applications, 2006
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Majumdar, S., Parthasarathy, H. Wavelet-Based Transistor Parameter Estimation. Circuits Syst Signal Process 29, 953–970 (2010). https://doi.org/10.1007/s00034-010-9181-9
Received:
Revised:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00034-010-9181-9