Abstract
We have investigated the behavior of two nanotube systems, carbon and boron nitride, under controlled applied voltages in a high-resolution transmission electron microscope (TEM) equipped with a scanning tunneling microscope (STM) unit. Individual nanotubes (or thin bundles) were positioned between a piezomovable gold electrode and a biased (up to ±140 V) STM tip inside the pole-piece of the microscope. The structures studied include double-and multi-walled carbon nanotubes (the latter having diverse morphologies due to the various synthetic procedures utilized), few-layered boron nitride nanotube bundles and multi-walled boron nitride nanotubes (with or without functionalized surfaces). The electrical breakdown, physical failure, and electrostatic interactions are documented for each system.
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Golberg, D., Costa, P.M.F.J., Mitome, M. et al. Nanotubes in a gradient electric field as revealed by STM TEM technique. Nano Res. 1, 166–175 (2008). https://doi.org/10.1007/s12274-008-8010-y
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DOI: https://doi.org/10.1007/s12274-008-8010-y